MARC details
| 000 -LEADER |
|---|
| fixed length control field |
01213nam a22003017a 4500 |
| 001 - CONTROL NUMBER |
|---|
| control field |
198770 |
| 003 - CONTROL NUMBER IDENTIFIER |
|---|
| control field |
MOEB |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
|---|
| control field |
20221223073822.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
890101s1989 enka g 001 0 eng |
| 010 ## - LIBRARY OF CONGRESS CONTROL NUMBER |
|---|
| LC control number |
90134813 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
0863411657 |
| 035 ## - SYSTEM CONTROL NUMBER |
|---|
| System control number |
(SITECODE)OLD6681 |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
Institut Teknologi Brunei |
| 084 ## - OTHER CLASSIFICATION NUMBER |
|---|
| Classification number |
TK7874 DES |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Massara, R. E., |
| Dates associated with a name |
1947 |
| 245 10 - TITLE STATEMENT |
|---|
| Title |
Design & test techniques for VLSI & WSI circuits / |
| Statement of responsibility, etc. |
edited by R.E. Massara. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
London, U.K. : |
| Name of publisher, distributor, etc. |
P. Peregrinus on behalf of the Institution of Electrical Engineers, |
| Date of publication, distribution, etc. |
1989. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
vi, 315 p. : |
| Other physical details |
ill. ; |
| Dimensions |
24 cm. |
| 440 #0 - SERIES STATEMENT/ADDED ENTRY--TITLE |
|---|
| Title |
IEE computing series ; |
| Volume/sequential designation |
15 |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
|---|
| Bibliography, etc. note |
Includes bibliographical references and index. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Integrated circuits |
| General subdivision |
Very large scale integration |
| -- |
Design and construction. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Integrated circuits |
| General subdivision |
Very large scale integration |
| -- |
Testing. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Integrated circuits |
| General subdivision |
Wafer-scale integration |
| -- |
Design and construction. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Integrated circuits |
| General subdivision |
Wafer-scale integration |
| -- |
Testing. |
| 710 2# - ADDED ENTRY--CORPORATE NAME |
|---|
| Corporate name or jurisdiction name as entry element |
Institution of Electrical Engineers. |
| 740 0# - ADDED ENTRY--UNCONTROLLED RELATED/ANALYTICAL TITLE |
|---|
| Uncontrolled related/analytical title |
Design and test techniques for VLSI & WSI circuits. |
| 998 ## - LOCAL CONTROL INFORMATION (RLIN) |
|---|
| Internal field |
Book |
| 911 ## - EQUIVALENCE OR CROSS-REFERENCE-CONFERENCE OR MEETING NAME [LOCAL, CANADA] |
|---|
| Meeting name or jurisdiction name as entry element |
1 |
| Number [OBSOLETE] |
admin admin |
| 912 ## - LOCAL DATA ELEMENT A (UTB) |
|---|
| Internal field |
1 |
| -- |
admin admin |
