000 00949nam a22002777a 4500
001 193220
003 MOEB
005 20221223072302.0
008 920101s1992 gw a g 001 0 eng
010 _a92003385
020 _a0139118012
035 _a92003385
035 _a(SITECODE)OLD25284
040 _aInstitut Teknologi Brunei
084 _aTK7868.D5 WEY
100 1 _aWeyerer, Manfred.
245 1 0 _aTestability of electronic circuits /
_cManfred Weyerer and Gerald Goldemund ; translated by Klaus Selke.
_h[Books].
260 _aMunich :
_bC. Hanser ;
_aEnglewood Cliffs, NJ :
_bPrentice Hall,
_c1992.
300 _axv, 232 p. :
_bill. ;
_c24 cm.
504 _aIncludes bibliographical references (p. 219-224) and index.
650 0 _aDigital electronics
_xTesting.
650 0 _aElectronic circuit design.
650 0 _aElectronic circuits
_xTesting.
700 1 _aGoldemund, Gerald.
998 _eBook
999 _c11157
_d11157
911 _a1
_badmin admin
912 _a1
_badmin admin