| 000 | 01213nam a22003017a 4500 | ||
|---|---|---|---|
| 001 | 198770 | ||
| 003 | MOEB | ||
| 005 | 20221223073822.0 | ||
| 008 | 890101s1989 enka g 001 0 eng | ||
| 010 | _a90134813 | ||
| 020 | _a0863411657 | ||
| 035 | _a(SITECODE)OLD6681 | ||
| 040 | _aInstitut Teknologi Brunei | ||
| 084 | _aTK7874 DES | ||
| 100 | 1 |
_aMassara, R. E., _d1947 |
|
| 245 | 1 | 0 |
_aDesign & test techniques for VLSI & WSI circuits / _cedited by R.E. Massara. |
| 260 |
_aLondon, U.K. : _bP. Peregrinus on behalf of the Institution of Electrical Engineers, _c1989. |
||
| 300 |
_avi, 315 p. : _bill. ; _c24 cm. |
||
| 440 | 0 |
_aIEE computing series ; _v15 |
|
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 |
_aIntegrated circuits _xVery large scale integration _xDesign and construction. |
|
| 650 | 0 |
_aIntegrated circuits _xVery large scale integration _xTesting. |
|
| 650 | 0 |
_aIntegrated circuits _xWafer-scale integration _xDesign and construction. |
|
| 650 | 0 |
_aIntegrated circuits _xWafer-scale integration _xTesting. |
|
| 710 | 2 | _aInstitution of Electrical Engineers. | |
| 740 | 0 | _aDesign and test techniques for VLSI & WSI circuits. | |
| 998 | _eBook | ||
| 999 |
_c15080 _d15080 |
||
| 911 |
_a1 _badmin admin |
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| 912 |
_a1 _badmin admin |
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