| 000 | 00659nam a22002177a 4500 | ||
|---|---|---|---|
| 001 | 199218 | ||
| 003 | MOEB | ||
| 005 | 20221223073948.0 | ||
| 008 | 870101s1987 nyua g 001 0 eng | ||
| 020 | _a0471851353 | ||
| 035 | _a(SITECODE)OLD7187 | ||
| 040 | _aInstitut Teknologi Brunei | ||
| 084 | _aTK7868 COR | ||
| 100 | 1 | _aCortner, J. Max. | |
| 245 | 1 | 0 |
_aDigital test engineering. / _cJ. Max Cortner. _h[Books]. |
| 260 |
_aNew York : _bJohn Wiley and Sons., _c1987. |
||
| 300 |
_axiv, 337p. : _bill. ; _c25 cm. |
||
| 650 | 0 | _aDigital electronics. | |
| 650 | 0 |
_aElectronic apparatus and appliances _xTesting. |
|
| 998 | _eBook | ||
| 999 |
_c15438 _d15438 |
||
| 911 |
_a1 _badmin admin |
||
| 912 |
_a1 _badmin admin |
||