| 000 | 00996nam a22002777a 4500 | ||
|---|---|---|---|
| 001 | 201259 | ||
| 003 | MOEB | ||
| 005 | 20221223074739.0 | ||
| 008 | 870101s1987 enka g 001 0 eng | ||
| 010 | _a86028174 | ||
| 020 | _a0471914347 | ||
| 035 | _a(SITECODE)OLD9664 | ||
| 040 | _aInstitut Teknologi Brunei | ||
| 084 | _aTK7871.85 AME | ||
| 100 | 1 | _aAmerasekera, E. A. | |
| 245 | 1 | 0 |
_aFailure mechanisms in semiconductor devices / _cE.A. Amerasekera and D.S. Campbell. _h[Books]. |
| 260 |
_aChichester [West Sussex] ; _aNew York : _bWiley, _c1987. |
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| 300 |
_axiii, 205 p. : _bill. ; _c24 cm. |
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| 500 | _aIncludes indexes. | ||
| 504 | _aBibliography: p. 179-195. | ||
| 650 | 0 |
_aSemiconductors _xFailures. |
|
| 700 | 1 | _aCampbell, D. S. | |
| 856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/enhancements/fy0607/86028174-d.html |
| 856 | 4 | 1 |
_3Table of contents only _uhttp://www.loc.gov/catdir/enhancements/fy0607/86028174-t.html |
| 998 | _eBook | ||
| 999 |
_c16939 _d16939 |
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| 911 |
_a1 _badmin admin |
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| 912 |
_a1 _badmin admin |
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