000 01010nam a22002897a 4500
001 186022
003 MOEB
005 20221223065937.0
008 900101s1990 nyua g 001 0 eng
010 _a89024887
020 _a0442318480
035 _a(SITECODE)OLD1696
040 _aInstitut Teknologi Brunei
084 _aTK5103 ATA
245 0 0 _aAT&T reliability manual /
_cedited by David J. Klinger, Yoshinao Nakada, Maria A. Menendez (AT&T Bell Laboratories).
_h[Book].
260 _aNew York :
_bVan Nostrand Reinhold,
_c1990.
300 _axi, 225 p. :
_bill ;
_c27 cm.
500 _aRev. ed. of: Reliability information notebook. 5th ed.
504 _aIncludes bibliographical references.
650 0 _aTelecommunication
_xEquipment and supplies
_xReliability.
700 1 _aKlinger, David J.
700 1 _aMenendez, Maria A.
700 1 _aNakada, Yoshinao.
710 2 _aAT & T Bell Laboratories.
730 0 _aReliability information notebook.
998 _eBook
999 _c6108
_d6108
911 _a1
_badmin admin
912 _a1
_badmin admin