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Design & test techniques for VLSI & WSI circuits / edited by R.E. Massara.
Material type:
TextSeries: IEE computing series ; 15Publication details: London, U.K. : P. Peregrinus on behalf of the Institution of Electrical Engineers, 1989. Description: vi, 315 p. : ill. ; 24 cmISBN: 0863411657Subject(s): Integrated circuits -- Very large scale integration -- Design and construction | Integrated circuits -- Very large scale integration -- Testing | Integrated circuits -- Wafer-scale integration -- Design and construction | Integrated circuits -- Wafer-scale integration -- TestingOther classification: TK7874 DES
| Item type | Current library | Call number | Status | Notes | Date due | Barcode |
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General Collection
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Universiti Teknologi Brunei Library | TK7874 DES c.1 (Browse shelf(Opens below)) | Available | Reg. No. 21888_ITB | 810253 |
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| TK7874 DAV c.1 Formal specification and verification in VLSI design / | TK7874 DEC c.1 Design and technology of integrated circuits / | TK7874 DEN c.2 VLSI signal processing : a bit-serial approach / | TK7874 DES c.1 Design & test techniques for VLSI & WSI circuits / | TK7874 DES c.1 Design of MOS VLSI circuits for telecommunications / | TK7874 DES c.1 Design systems for VLSI circuits : logic synthesis and silicon compilation / | TK7874 DIL c.1 VLSI engineering / |
Includes bibliographical references and index.
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